Volume 45 Issue 11
Nov.  2024
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WANG Xishun, GUO Hao, ZHU Qingfeng, DU Yuehao, MIAO Hongchen. A Guided-Wave-Based Method for Detecting Defects in the Adhesive Layer of the Steel-Epoxy-Steel Sandwich Structure[J]. Applied Mathematics and Mechanics, 2024, 45(11): 1416-1427. doi: 10.21656/1000-0887.450193
Citation: WANG Xishun, GUO Hao, ZHU Qingfeng, DU Yuehao, MIAO Hongchen. A Guided-Wave-Based Method for Detecting Defects in the Adhesive Layer of the Steel-Epoxy-Steel Sandwich Structure[J]. Applied Mathematics and Mechanics, 2024, 45(11): 1416-1427. doi: 10.21656/1000-0887.450193

A Guided-Wave-Based Method for Detecting Defects in the Adhesive Layer of the Steel-Epoxy-Steel Sandwich Structure

doi: 10.21656/1000-0887.450193
  • Received Date: 2024-07-01
  • Rev Recd Date: 2024-08-14
  • Publish Date: 2024-11-01
  • Steel epoxy sleeves are widely used to repair oil and gas pipelines. The integrity of the epoxy layer between the sleeve and the pipeline directly determines the quality of the repair. Due to the unique sandwich structure formed by the sleeve, the epoxy layer, and the pipeline, traditional nondestructive testing methods have difficulty effectively identifying defects in the epoxy layer. Therefore, there is an urgent need to develop new nondestructive testing methods. A guided-wave-based method was developed for detecting defects in the adhesive layer of the steel-epoxy-steel sandwich structure. Firstly, the dispersion curves of guided waves in the sandwich structure were calculated with the semi-analytical finite element method. The LS1 wave was selected to detect defects in the adhesive layer based on the dispersion characteristics, waveform structures, and attenuation properties. Subsequently, a piezoelectric transducer capable of exciting LS1 waves was designed. The effectiveness of the transducer was verified through numerical simulations and experiments. Then, numerical simulations and experiments were conducted to study the interaction between LS1 waves and cavity defects in the adhesive layer. The results show that, with a defect length within 4 times of the wavelength, the amplitude of the LS1 wave's reflected wave would change approximately linearly with the defect length. Based on this, a signal processing method is proposed, which can effectively identify defect reflection signals when the defect size is not less than twice the wavelength.
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