Zhou Yuan-quan. Reliability Growth for Multi-System Simultaneous Development[J]. Applied Mathematics and Mechanics, 1986, 7(9): 831-837.
	
		
			Citation: 
			 
			 
													Zhou Yuan-quan. Reliability Growth for Multi-System Simultaneous Development[J]. Applied Mathematics and Mechanics, 1986, 7(9): 831-837. 								 
				
			 
		 
	
 
	
		Zhou Yuan-quan. Reliability Growth for Multi-System Simultaneous Development[J]. Applied Mathematics and Mechanics, 1986, 7(9): 831-837.
	
		
			Citation: 
			 
			 
													Zhou Yuan-quan. Reliability Growth for Multi-System Simultaneous Development[J]. Applied Mathematics and Mechanics, 1986, 7(9): 831-837. 								 
				 
		 
	
  
			
				
					
						
Reliability Growth for Multi-System Simultaneous Development 
					
					
						 
					
					
					
                        
		    		
						
							
							
							Received Date:  1985-09-11 
									 
								Publish Date: 
											1986-09-15 
									
	                     
	                  
                 
             
            
            	
                
                 
				
                    Abstract 
                        
                            In this paper the AMSAA model for multi-system simultaneous development is discussed.The maximum likelihood(ML) estimates of the parameters and the confidence intervals of the MTBF for Weibull process are presented.Crow's formulae[1]  are the special examples for this paper.
                     
                
                 
                
               	
	                
	                     
	                 
                
                
				
	                    References 
	                    
	
		
				[1] 
				
					Crow,L.H.,Technometrics,24,1(1982),67-72.
					
					 
			 
		
				[2] 
				
					Crow,L.H,ADA-044788(1977).
					
					 
			 
		
				[3] 
				
					Duane,J.T,IEEE,Trans,on Aerospace & Electronic system,2(1964),563-566.
					
					 
			 
		
				[4] 
				
					Fisz,M,《概率论及数理统计》,上海科技出版社(1962),341.
					
					 
			 
		
				[5] 
				
					Lee,L.and S.K.Lee,Some results on inferences fo the weibull process,Technometrics,20(1978),41-45.
					
					 
			 
		
  
                
                 
				
				
                     
                
				
				
				
						 
				
                 
		
		
		
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